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Dean's Book Chapter Series

  1. Shen-Li Chen*, "The I-V Characteristic Prediction of BCD LV pMOSFET Devices based on an ANFIS-Based Methodology," Videleaf Publisher, pp. 1-20, Jan. 2021.
  2. Shen-Li Chen*, Pei-Lin Wu and Yu-Jen Chen, "Robust ESD-Reliability Design of 300-V Power N-channel LDMOSs with the Elliptical Cylinder Super-junctions in the Drain Side," Industrial Applications of Power Electronics (ISBN: 978-3-03943-483-1), pp. 265-278, MDPI Publisher(Editor: Eduardo M. G. Rodrigues), Basel, Switzerland, Dec. 2020.
  3. Po-Lin Lin, Shen-Li Chen* and Sheng-Kai Fan, "ESD-Immunity Impacts in 300 V nLDMOS by Comprehensive Drift-region Engineering," Intelligent Electronic Devices (ISBN: 978-3-03928-973-8), pp. 91-104, MDPI Publisher(Editor: Teen-Hang Meen), Basel, Switzerland, May 2020.
  4. Shen-Li Chen*, Yi-Cih Wu, "Sensing and Reliability Improvement of Electrostatic-Discharge Transient by Discrete Engineering for High-Voltage 60-V N-Channel Lateral-Diffused MOSFETs with Embedded Silicon-Controlled Rectifiers," Top 5 Contributions on Sensor and Biosensor Technology, 2nd Edition (ISBN: 978-93-88170-19-2), pp. 2-22, AVID SCIENCE Publisher(Editor: Priyanka), Berlin, Germany, Dec. 2018.
  5. Shen-Li Chen*, Chun-Ju Lin, and Yu-Ting Huang, "Impacts of ESD Reliability by Different Layout Engineering in the 0.25-um 60-V High-voltage LDMOS Devices," Nano Devices and Sensors (ISBN 978-1-5015-1050-2), pp. 177-197, De Gruyter Publisher, Berlin, Germany, Mar. 2016.
  6. Shen-Li Chen*, Shawn Chang, Yu-Ting Huang, Shun-Bao Chang, "Anti-ESD Improvement by the Bulk-FOX Structure in HV nLDMOS Devices,” Lecture Notes in Electrical Engineering (ISBN: 978-3-319-17313-9), vol. 345, Chap. 73, pp.571-577, New York, USA, Springer publisher, Jan. 2016.
  7. Shen-Li Chen*, Yu-Ting Huang, Shawn Chang, Shun-Bao Chang, "N+ Extended-Distribution Influences on Anti-ESD Ability in the 60-V pLDMOS-SCR (NPN arranged-type),” Lecture Notes in Electrical Engineering (ISBN: 978-3-319-17313-9), vol. 345, Chap. 74, pp.579-585, New York, USA, Springer publisher, Jan. 2016.
  8. Shen-Li Chen*, Min-Hua Lee, Chun-Ju Lin, Yi-Sheng Lai, Shawn Chang, and Yu-Ting Huang, "ESD Performance Influence of a 60-V Lateral-diffused-MOST by the FOD Based (& Dotted-OD) Drain", Lecture Notes in Electrical Engineering- Intelligent Technologies and Engineering Systems (ISBN: 978-3-319-04572-6), vol. 293, Chap. 108, pp.883-890, New York, USA, Springer publisher, 2014.
  9. Shen-Li Chen*, Min-Hua Lee, Yi-Sheng Lai, Chun-Ju Lin, Yu-Ting Huang, and Shawn Chang, "Effect of Drain FODs on ESD/LU Immunities in the 60V High-voltage nLDMOS", Lecture Notes in Electrical Engineering- Intelligent Technologies and Engineering Systems (ISBN: 978-3-319-04572-6), vol. 293, Chap. 107, pp.875-882, New York, USA, Springer publisher, 2014.