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Dean's Referred Journal Papers

  1. Shi-Zhe Hong, Shen-Li Chen*, Hung-Wei Chen, and Yi-Mu Lee, "Drain Side Area-modulation Effect of Parasitic Schottky Diode on ESD Reliability for High Voltage P-channel Lateral-Diffused MOSFETs," IEEE Electron Device Letters, vol. 42(10), pp. 1512-1515, Oct. 2021.
  2. Tien-Yu Lan, Shen-Li Chen*, Hung-Wei Chen, and Yi-Mu Lee, "Research on ESD Protection of Ultra-high Voltage nLDMOS Devices by Super-junction Engineering in the Drain-side Drift Region," IEEE Journal of the Electron Devices Society, vol.9, pp. 763-777, Aug. 2021.
  3. Shi-Zhe Hong and Shen-Li Chen*, "ESD Design and Analysis by Drain Electrode-embedded Horizontal Schottky Elements for HV nLDMOSs," Electronics, vol. 10(1), pp. 178-1 - 178-15, Jan. 2021.
  4. Po-Lin Lin, Shen-Li Chen* and Sheng-Kai Fan, "Enhance the ESD Ability of UHV 300-V Circular LDMOS Components by Embedded SCRs and the Robustness P-body Well," IEEE Journal of the Electron Devices Society, vol.9, pp. 108-113, Jan. 2021.
  5. Po-Lin Lin, Shen-Li Chen* and Sheng-Kai Fan, "ESD-Performance Enhancement of Circular Ultra-High-Voltage 300-V N-Channel Lateral-Diffused MOSFETs by Source/Drain Embedded Schottky Diodes," IEEE Electron Device Letters, vol. 41(11), pp. 1673-1676, Nov. 2020.
  6. Hung-Wei Chen, Shen-Li Chen*, Yu-Ting Huang, and Hsun-Hsiang Chen, "ESD improvements on power N-channel LDMOS devices by the Composite Structure of super junctions integrated with SCRs in the drain side," IEEE Journal of the Electron Devices Society, vol.8, pp. 864-872, Jul. 2020.
  7. Shen-Li Chen* and S.P. Lee, "Optimized Design of the 100-V Silicon Based Power N-channel LDMOS Transistor," Modern Concepts in Material Science, vol. 3(2), pp. 559-1 - 559-6, Jul. 2020.
  8. Shen-Li Chen*, Pei-Lin Wu and Yu-Jen Chen, "Robust ESD-Reliability Design of 300-V Power N-channel LDMOSs with the Elliptical Cylinder Super-junctions in the Drain Side," Electronics, vol. 9(4), pp. 730-1 - 730-14, Apr. 2020.
  9. Sheng-Kai Fan, Shen-Li Chen*, Po-Lin Lin, and Hung-Wei Chen, "Layout Strengthening the ESD Performance for High-voltage N-channel Lateral Diffused MOSFETs," Electronics, vol. 9(4), pp. 718-1 - 718-20, Apr. 2020.
  10. Po-Lin Lin, Shen-Li Chen* and Sheng-Kai Fan, "ESD-Immunity Impacts in 300 V nLDMOS by Comprehensive Drift-region Engineering," Electronics, vol. 8(12), pp. 1469-1-1469-14, 2019.
  11. Shen-Li Chen*, Pei-Lin Wu, Yu-Lin Jhou, Po-Lin Lin and Sheng-Kai Fan, " ESD-Protection Design of UHV Circular N-channel LDMOSs by the Drift Region with Elliptical Cylinder Super-junctions," Advances in Technology Innovation, Dev. 2019 (accepted).
  12. Shen-Li Chen*, Pei-Lin Wu and Po-Lin Lin, "ESD-Reliability Enhancement of Circular UHV 300-V Power nLDMOSs by the Drain-side Superjunction Structure," IEEE Electron Device Letters, vol. 40(4), pp. 597-600, Apr. 2019.
  13. Shen-Li Chen*, Yi-Cih Wu, "Sensing and Reliability Improvement of Electrostatic-Discharge Transient by Discrete Engineering for High-Voltage 60-V N-Channel Lateral-Diffused MOSFETs with Embedded Silicon-Controlled Rectifiers," Sensors, vol. 18(10), pp. 3340-1-3340-10, Oct. 2018.
  14. Shen-Li Chen*, Yu-Ting Huang, and Shawn Chang, "Design and Impact on ESD/LU Immunities by Drain-side Super-junction Structures in Low-(High-)Voltage MOSFETs for the Power Applications," IEICE Trans. on Electronics, vol. E101-C (3), pp. 141-150, Mar. 2018.
  15. Shen-Li Chen*, Chun-Ju Lin, and Yu-Ting Huang, "Impacts of ESD Reliability by Different Layout Engineering in the 0.25-um 60-V High-voltage LDMOS Devices," Physical Sciences Reviews, vol.3, issue 2, pp. 1-15, Feb. 2018.
  16. Shen-Li Chen*, Yu-Ting Huang, and Yi-Cih Wu, "Design of High-ESD Reliability in HV Power pLDMOS Transistors by the Drain-side Isolated SCRs," IEICE Trans. on Electronics, vol. E100-C (5), pp. 446-452, May 2017.
  17. Shen-Li Chen* and Min-Hua Lee, "Impacts of Leakage-Biasing Failure-mode Identification in the Transmission-Line Pulse Testing for Low-voltage/High-voltage MOSFET Components," IEEE Transactions on Industry Applications, vol. 53(3), pp.2888-2893, Mar. 2017.
  18. Shen-Li Chen* and Shawn Chang, "Robust Reliability and Electrical Performances by the Bulk-Contact in 60-V p-channel LDMOS Power Components," International Journal of Green Energy, vol. 14(3), pp. 239-244, Mar. 2017.
  19. Shen-Li Chen* and Dun-Ying Shu, "Measurement Forecast of Anomalous Threshold Voltages in BCD LV Submicron n-MOSFETs with Two Artificial Intelligence Methods", Measurement, vol. 100, pp. 93-98, Mar. 2017.
  20. Shen-Li Chen*, Kuei-Jyun Chen, H.-W. Chen, "ESD Protection Design and Enhancement in the Power 60-V N-channel LDMOS by Embedded-SCR Anode Islands," Electronics Letters, vol. 52(19), pp. 1639-1640, Sep. 2016.
  21. Shen-Li Chen* and Yu-Ting Huang, "Design and Layout Strategy in the 60-V Power pLDMOS with Drain-End Modulated Engineering of Reliability Considerations", IEEE Transactions on Power Electronics, vol. 31(7), pp.5113-5121, Jul. 2016.
  22. Hung-Wei Chen, Yi- Mu Lee, and Shen-Li Chen, "The Taste Sensors with Conductivity Measurement," The Open Materials Science Journal, vol. 10, pp. 37-43, 2016.
  23. Yeong-Lin Lai, Edward Y. Chang, Shen-Li Chen, K. B. Wang, Chun-Yi Zheng and Wen-Jung Chiang, "Characteristics of GaAs Power MESFETs with Double Silicon Ion Implantations for Wireless Communication Applications," The Open Materials Science Journal, vol. 10, pp. 29-36, 2016.
  24. Shen-Li Chen*, Chin-Chai Chen, Yeong-Lin Lai, Wen-Jung Chiang and Hung-Wei Chen, "PL Intensity and Life-time Enhancements of the n-GaN Light-Emitting Diode During the Device Fabrication," The Open Materials Science Journal, vol. 10, pp. 20-28, 2016.
  25. Shen-Li Chen*, "Editorial: Advanced Microelectronic and Nanoscale Semiconductor Materials & Applications," The Open Materials Science Journal, vol. 10, pp. 18-19, 2016.
  26. Shen-Li Chen* and Min-Hua Lee, "ESD-Reliability Influences of an HV nLDMOS with Different Embedded SCR Structures in the Drain Side", International Journal of Electrical and Electronics Engineering Research, vol. 6 (2), pp. 37-44, Apr. 2016.
  27. Shen-Li Chen* and Min-Hua Lee, "Reliability Analysis of P+ Pickup on Anti-ESD Performance in Four CMOS Low-voltage Technology Nodes," IETE Journal of Research, vol. 62(6), pp. 752-761, Apr. 2016.
  28. Shen-Li Chen* and Yu-Ting Huang, "Design of Reliability Improvement in HV p-channel LDMOS DUTs by a 0.25um 60-V BCD Process", International Journal of Electronics and Electrical Engineering, vol. 4 (3), pp. 210-214, Mar. 2016.
  29. Shen-Li Chen*, Min-Hua Lee, and Chun-Ju Lin, "Protection Design of the SCR Cooperation on ESD Reliability Performance in Microelectronics of Low-voltage/High-voltage N-channel MOSFET Devices," Wulfenia (Journal), vol. 22 (12-pt.2), pp. 7-21, Dec. 2015.
  30. Shen-Li Chen* and Yi-Sheng Lai, "Strengthen Anti-ESD Characteristics in an HV LDMOS with Super-Junction Structures," IEEE Transactions on Power Electronics, vol. 30 (5), pp. 2375-2382, May 2015.
  31. Shen-Li Chen*, "The I-V Characteristic Prediction of BCD LV pMOSFET Devices Based on an ANFIS-Based Methodology", Advances in Fuzzy Systems, vol. 2015, pp. 824524-1~ 824524-8, Feb. 2015.
  32. Shen-Li Chen*, Shawn Chang, Chun-Hsing Shih, Hsun-Hsiang Chen, "ESD-Reliability Analysis and Strategy of the GaN-based Light-Emitting Diodes", Key Engineering Materials, vols. 656-657, pp. 57-62, May 2015.
  33. Shen-Li Chen*, Tsung-Shiung Lee, Yu-Ting Huang, "Impacts of MOS Device Characteristic Under Different Oxygen-Dose Participations in the Silicon Substrate", Key Engineering Materials, vols. 656-657, pp. 8-13, May 2015.
  34. Shen-Li Chen*, Shawn Chang, Yu-Ting Huang, Shun-Bao Chang, "Reliability Enhancement in the 60 V Power pLDMOS by a Bulk-FOD Engineering," Advanced Materials Research, vols. 1079-1080, pp. 506-509, Jan. 2015.
  35. Shen-Li Chen* and Hung-Wei Chen, "Pseudo-Failure Impacts on ESD Robustness in Integrated Circuits I/O Ports by the Parasitic Capacitance", The Open Electrical and Electronic Engineering Journal, vol. 8, pp. 143-251, Dec. 2014..
  36. Shen-Li Chen*, "Enhanced Electrostatic Discharge Reliability in GaN-Based Light-Emitting Diodes by the Electrode Engineering", IEEE/OSA Journal of Display Technology, vol. 10, no.10, pp. 779-785, Oct. 2014.
  37. Shen-Li Chen* and Chun-Ju Lin, "Layout Structure Dependence of 60-V nLDMOS Devices in the Anti-ESD Reliability Consideration", Journal of Electrical and Control Engineering, vol. 4(5), pp. 1-9, Oct. 2014.
  38. Shen-Li Chen* and Shih-Hua Hsu, "Design of a High Performance Green-Mode PWM Controller IC with Smart Sensing Protection Circuits," Sensors and Transducers Journal, vol. 176, issue 8, pp. 210-218, Aug. 2014.
  39. Shen-Li Chen* and Min-Hua Lee, "A Comprehensive Evaluation of Drain-side Layout Topologies on the Power nLDMOS ESD/LU of Applied Sciences, Engineering and Technology, vol. 8(4), pp. 496-502, Jul. 2014.
  40. Shen-Li Chen* and Yi-Sheng Lai, "Anti-ESD Improvement of a Power nLDMOS with a Perpendicular Super-junction Construction in the Drain Side", Applied Mechanics and Materials, Vol. 595, pp. 195-200, Jun. 2014.
  41. Shen-Li Chen*, Wen-Ming Lee and Chi-Ling Chu, "ESD Failure Analysis and Robustness Design in Vertical-Diffused MOS Transistors", Advanced Materials Research, Vols. 926-930, pp.456-461, Jun. 2014.
  42. Shen-Li Chen*, Wen-Ming Lee, Chi-Ling Chu, "EMMI Failure-Distributed Analysis of ESD Zapping and Protection Designs in Power VDMOS ICs", International Journal of Energy Science, vol.4, issue 3, pp. 77-84, Jun. 2014.
  43. Shen-Li Chen* and Dun-Ying Shu, "By Using Grey System and Fuzzy-Neural Network to Predict the Threshold Voltage of Complicated Sub-micron MOSFETs", WIT Transactions on Engineering Sciences, vol. 92, pp. 537-544, Jun. 2014.
  44. Shen-Li Chen*, Wen-Ming Lee and Chi-Ling Chu, "ESD Hazard Analysis of VDMOS Power Components by Photoemission Spectroscopy", WIT Transactions on Information and Communication Technologies, vol. 56, pp. 721-728, May 2014.
  45. Shen-Li Chen* and Min-Hua Lee, "Highly ESD Reliable HV Power nLDMOS Device with the Bulk FODs Design Technique", Energy Education Science and Technology, Part A: Energy Science and Research, vol. 32 (5), pp.3115-3124, May 2014.
  46. Shen-Li Chen* and Min-Hua Lee, "ESD Reliability Improvement of an HV nLDMOS by the Bulk FODs Engineering", AASRI Procedia -Journal- Elsevier, USA, vol. 7, pp. 114-119, May 2014.
  47. Shen-Li Chen* and Min-Hua Lee, "Impacts of the Drain-side nWell Adding on ESD Robustness in 0.25-um LV/HV nMOSTs", AASRI Procedia -Journal- Elsevier, USA, vol. 7, pp. 51-56, May 2014.
  48. Shen-Li Chen*, Min-Hua Lee, "Drain Side nWell Influences on the Reliability Immunity of 0.25-um LV/HV GGnMOS Devices by TLP Testing and EDA Simulation", WIT Transactions on Modelling and Simulation, vol. 60, pp. 1181-1185, Apr. 2014.
  49. Shen-Li Chen*, Der-Ann Fran, "Improvement on ESD Protection of Output Driver in DC Brushless Fan ICs by the FOD Protection Block", Advanced Materials Research, Vols. 850-851, pp.449-453, Mar. 2014.
  50. Shen-Li Chen*, Min-Hua Lee, "Impact of Drain-side nWell Engineering on ESD Robustness in 0.35 um LV MOSTs", Advanced Materials Research, Vols. 850-851, pp.7-11, Mar. 2014.
  51. Shen-Li Chen* and Yang-Shiung Cheng, "Signal Sensing by the Architecture of Embedded I/O Pad Circuits", International Journal on Smart Sensing and Intelligent Systems, vol. 7, no. 1, pp.196-213, Mar. 2014.
  52. Shen-Li Chen*, Min-Hua Lee, "A Novel ESD/LU Protection Structure with Drain FODs for High-voltage nLDMOS Applications", WIT Transactions on Information and Communication Technologies, vol. 49, pp. 533-540, Feb. 2014.
  53. Shen-Li Chen*, Chun-Ju Lin, "Layout-type Dependence on ESD/LU Immunities for LVTnSCR Devices in LV Applications", WIT Transactions on Information and Communication Technologies, vol. 49, pp. 525-532, Feb. 2014.
  54. Shen-Li Chen* and Der-Ann Fran, "Implementation of ESD Protection for Output Driver ICs with SCR Circuits Techniques", Applied Mechanics and Materials, vol. 464, pp.139-144, Feb. 2014.
  55. Shen-Li Chen*, Yi-Sheng Lai, "Effects of Source Pick-up Adding and ESD Implanted Layer on ESD Reliability of LV GGnMOSTs", WIT Transactions on Engineering Sciences, vol. 87, pp. 175-182, Jan. 2014.
  56. Shen-Li Chen*, Min-Hua Lee, "The Pick-up Strategy of Multi-finger GDpMOSTs on ESD Robustness in a 0.35 um Process Technology", WIT Transactions on Engineering Sciences, vol. 87, pp. 165-173, Jan. 2014.
  57. Shen-Li Chen*, Min-Hua Lee, "Impact of FODs Adding on the ESD/LU Reliabilities in 0.35 um 3.3 V LV nMOSTs”, WIT Transactions on Engineering Sciences, vol. 87, pp. 155-163, Jan. 2014.